- Sponsored by SICE
- Co-sponsored by IMEKO TC3
- Organized by NMIJ/AIST
- Chikayoshi Maeda (Japan)
- Wang Liji (China)
- Kazunaga Ueda (Japan)
- Zhang Yue (China)
- Chen Soo Fatt (Malaysia)
- Jin Wan Chung (Korea)
- Kitty Fen (Australia)
- Lee Shih Mean (Singapore)
- John Man (Australia)
- Chris Sutton (New Zealand)
- Masaaki Ueki (Japan)
- Veera Tulasombut (Thailand)
- Zhang Zhimin (China)
- Kazunaga Ueda (NMIJ/AIST)
- Toru Kohashi (Yamato Scale Co., Ltd.)
- Noboru Murakami (Murakami Koki Co., Ltd.)
- Yutaka Murata (A&D Co., Ltd.)
- Kenzo Noguchi (Showa Measuring Instruments Co., Ltd.)
- Haruki Okano (Tokyo Sokki Kenkyujo Co., Ltd.)
- Kenji Saito (Sartorius Mechatronics Japan K.K.)
- Naoya Shinozaki (Shinko Denshi Co., Ltd.)
- Shoko Tajiri (Ishida Co., Ltd.)
- Yoichiro Takayanagi (Mettler-Toledo K.K.)
- Hiroki Teshigawara (Spectris Co., Ltd.)
- Takanori Yamazaki (Oyama National College of Technology)
- Toshiyuki Hayashi (NMIJ/AIST)
- Hiroshi Maejima (NMIJ/AIST)
- Atsuhiro Nishino (NMIJ/AIST)
- Koji Ohgushi (NMIJ/AIST)
- Jianxin Sun (NMIJ/AIST)
- Shigeru Kurosu (Crotech)
- Yoshikazu Watabe (Mettler-Toledo K.K.)
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